General Dynamic Characterization Platform for TO-247-3
AZ-SiC-EVB-DCP01
A versatile Dynamic Characterization Solution for Power Semiconductor Device Dynamic characterizations, for device ratings up to 1200V. Using AZ Power's Modular Gate Driver Solution, different Driving voltage, external gate resistance can be switched with great ease. This board can be utilized for MOSFET switching time, MOSFET switching energy loss, MOSFET Avalanche, Diode/Body Diode Switching. When Properly assembled, the platform can also perform temperature dependent dynamic tests when combined with a hot plate.
Dynamic Characterization Platform for Diode Avalanche
AZ-SiC-EVB-DCP02
A Dynamic Characterization Solution for Power Semiconductor Dynamic characterizations, for diode ratings up to 1200V. This board compensates the general Dynamic Characterization Platform to provide the diode avalanche test. Using AZ Power's Modular Gate Driver Solution, different Driving voltage, external gate resistance can be switched with great ease. This board is specially designed for Diode Avalanche tests. When Properly assembled, the platform can also perform temperature dependent tests when combined with a hot plate.
General Dynamic Characterization Platform for TO-247-4
AZ-SiC-EVB-DCP03
A complete Dynamic Characterization Solution for Power Semiconductor Device Dynamic characterizations, for device ratings up to 1200V. Using AZ Power's Modular Gate Driver Solution, different Driving voltage, external gate resistance can be switched with great ease. This board can be utilized for MOSFET switching time, MOSFET switching energy loss, MOSFET Avalanche, Diode/Body Diode Switching. When Properly assembled, the platform can also perform temperature dependent dynamic tests when combined with a hot plate.